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Measure T & R simultaneously.
Determine layer thickness for single and multilayers with ease.
Determine optical properties and absorption for all types of materials - transparent, absorbing, dielectric, polymers, semiconductors, organic semiconductors and polymers etc.
Take advantage of advanced features such as a the heated stage, sample mapping and small spot sizes.
The extensive application capabilities of the nkd include :
- Transparent substrates
- Thick and thin layers
- High and low index (n) layers
- Plastics & polymers
- Optical coatings
- Display technology
- Organic and Inorganic semiconductors
- Metal films
- Dielectric films
- DBR structures
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